Semiconductor Inspection Metallurgical Microscopes

Semiconductor fabrication and component analysis demand microscopes built for reflected light imaging, high magnification, and consistent measurement. This category at Microscope.com features metallurgical systems tailored to wafers, dies, bump bonds, lead frames, and PCB features, supporting defect review, failure analysis, and process control. Options include brightfield/darkfield, coaxial illumination, DIC, and polarized contrast, with long working distance objectives, ESD-conscious stands, and cleanroom-friendly materials. Motorized or manual stages, ergonomic heads, and calibrated software support repeatable inspections and documentation. Compare models by illumination type, magnification range, working distance, and camera compatibility to match task and budget. Equip QA, R&D, and production teams with imaging tools that deliver clarity, stability, and reliable results across demanding microelectronic workflows.