
Motic Panthera TEC MAT - BD 6"x4" Trinocular Microscope, Siedentopf type
- Versatile Material Inspection: Ideal for industrial quality control and technical education, offering high-value performance for semiconductor and material analysis.
- Comprehensive Contrast Methods: Combines Brightfield, Darkfield, and Cross-Polarization with Motic’s unique segmental illumination for diverse imaging needs.
- Innovative Segmental Illumination: Enables oblique incident light to easily detect scratches and surface defects on flat, reflective samples without moving the specimen.
- Superior Optical Performance: Features a 5-fold nosepiece equipped with LD Plan BD objectives for exceptional image clarity and precision.
Panthera TEC MAT Series: Powerful Solutions for Material Sciences
Precision Engineering for Semiconductors, LCD Panels, and Wafer Inspection
The Missing Link in Industrial Microscopy
The Panthera TEC MAT series is the premier industrial solution within the Panthera family. Specifically designed for material sciences, these incident light microscopes are engineered to handle the complexities of semiconductors, LCD panels, and silicon wafers. With a sophisticated Brightfield/Darkfield illumination concept and optional integrated Transmitted LED light, the TEC MAT series adapts to any compound material application.
Innovative Smart Features
- Motic LightTracer: A "smart" coded nosepiece and digital intensity knob that remembers your light settings for each objective. Includes an auto-sleep mode to preserve energy and hardware life.
- Smart Darkfield: Advanced 5-segment illumination mode allows for topographical analysis of surface defects that standard illumination might miss.
- Premium CCIS® Optics: Equipped with LD Plan Achromatic and S-Apochromatic BD objectives providing a superior 22mm Field of View (FOV).
- Interchangeable LED: Customize your workflow with interchangeable LED color temperatures to match specific material requirements.
Choose Your Model
The Panthera TEC MAT is available in four configurations to balance Brightfield (BF), Darkfield (BD), and Transmitted (T) light requirements.
| Feature | TEC MAT BF | TEC MAT BF-T | TEC MAT BD | TEC MAT BD-T |
|---|---|---|---|---|
| Contrast Technique | Brightfield | Brightfield + Transmitted | BF / Darkfield | BF / DF + Transmitted |
| Illumination | Incident 3W LED | Incident & Transmitted | 3W Smart Segmental | 3W Smart Segmental & Transmitted |
| Objective Mount | W 4/5" (RMS) | W 4/5" (RMS) | M32 High-Aperture | M32 High-Aperture |
| Stage Size | 300x180mm with 150x100mm (6"x4") travel range | |||
Technical Specifications
Optical Excellence
- Optical System: Colour Corrected Infinity Optical System (CCIS®).
- Viewing Tube: Siedentopf type Trinocular head, 25º inclined, 360º swiveling with a fixed 50:50 light split for simultaneous viewing and imaging.
- Eyepieces: Widefield UC-WF10X/22mm with +/- 4 diopter adjustment.
- Nosepiece: Reversed quintuple, coded for digital integration.
Mechanical Precision
- Focusing: Coaxial coarse and fine system with 2µm precision and 25mm total stroke.
- Stage: Hard-coated mechanical stage with low-position coaxial controls and glass plate for sample versatility.
- Dimensions: 410x300x450mm; Weight: Approx 10.5kg.
Industry Applications
The Panthera TEC MAT is the go-to choice for quality control and research in:
- Electronics: PCB inspection and micro-component analysis.
- Metallurgy: Grain structure and alloy composition.
- Materials Science: Composite materials, polymers, and ceramics.
- Forensics: High-resolution surface documentation.
Ready to Optimize Your Material Analysis?
Experience the precision of Motic's Smart Microscopy
Order your Panthera TEC MAT today for reliable, high-resolution industrial inspection.
| Brand | Motic |
|---|---|
| Recommended For | 0 |
| Trinocular Tube Focusable? | No |
| Parfocal | No |
| Focus Controls Graduated? | No |
| Stage Range Graduated? | No |
| Includes Eyepieces? | No |
| Includes Eyecups? | No |
| Included Objectives Parfocal Adjustable? | No |
| Reticles Available? | No |
| Case Included? | No |
















