Reflected Light Microscopes for Opaque Samples

Reflected-light microscopy supports inspection and analysis of opaque samples such as metals, ceramics, semiconductors, and coated parts without sectioning. Engineered for surface characterization, these metallurgical systems use episcopic illumination to reveal grain structure, inclusions, phase contrast, and defects on polished or as-cast surfaces. Configure brightfield, darkfield, polarization, and DIC to enhance contrast across different roughness levels and coatings. Long working distance objectives, stable stands, and ergonomic controls help deliver repeatable measurements and clear documentation for quality assurance, failure analysis, and research and development. At Microscope.com, compare configurations, optics, and camera options to match throughput and resolution needs in materials labs and production environments. Choose solutions that support consistent results, from microstructure verification to welds, microelectronics, and additive builds.